Virtual Reference Analyser

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Virtual Reference™ Analyser
Optical Component Test Set

The Virtual Reference™ Analyser is Inometrix's flagship product and is based on Inometrix's patent-pending Virtual Reference™ Technology. It is the most accurate commercial system for measuring the dispersion properties of short-length optical components.

Inometrix’s patent-pending Virtual Reference™ Technology eliminates the need for expensive temperature control and error-inducing calibration to provide a consistently stable measurement and provide reliable characterization to accuracy orders of magnitude above the standard technologies in a fraction of the time.

The system can by used to measure:

1st & 2nd order Chromatic Dispersion (CD)
Group Delay (GD)
Group Velocity Dispersion (GVD)

Additionally, if the device length is known:

Dispersion Parameter (D)
Group Index (GI)
Group Velocity (GV)

"One million times better than anything available on the market today" - Michael Galle C.E.O. Inometrix Inc.

The Virtual Reference™ Analyser is used with an external third-party tunable laser¹, and is a simple plug and play system that requires no callibration, no training to use, and no dedicated optical table.

Features:

Characterization for the whole wavelength range in a single sweep
No callibration required
Orders of magnitude higher thermal & vibration stability
Orders of magnitude higher sensitivity and accuracy
Can characterize components standard interferometry cannot
No minimum device length
No need to invest in optical tables or lab space

Detailed Specification Sheet

Applications:

Fiber/waveguide testing (including PCF, DCF)
Optical network component test
Non-linear optical devices
Fiber lasers
Quality Assurance Testing

Measurement Capability:

1st & 2nd order Chromatic Dispersion (CD)
Dispersion Parameter² (D)
Group Delay (GD)
Group Index² (GI)
Group Velocity² (GV)
Group Velocity Dispersion (GVD)

(1) Coherence length of third party tunable laser must exceed 30m and must include built-in wavemeter with minimum 100,000 data points per scan.
(2) When device length is known.